X-Ray diffraction (XRD) is a quick scientific procedure utilized for stage distinguishing proof of a crystalline material and can give data on unit cell measurements 27. The XRD of 20wt% TiB2 added Al2O3/SiC composite sample was recorded with the help of Xpert-Pro Diffractometer with Cu K radiation. The data are measured at 1300oC and at a wavelength of 1.5420 nm. The diffraction peaks of sample D was observed at 2? values of angles 34.8, 35.6, 38.2, 54.3, 60.0 and 71.7 The XRD used to calculate the crystallite size (D) with the help of Scherrer’s relation.  

 

                                                                                                                                                  (1)

Where, k is the shape factor usually (k=0.94), ? is the X-ray wavelength, and ? is the Full Width at Half Maximum (FWHM) of all the peaks in XRD pattern and ? is the Bragg’s angle of the X-ray diffraction peak. The average crystallite sizes ware found to be 85 nm for 1300oC. Table 4 shows the XRD values of the processed composite. The high-intensity peak observed at 2? = 38.2255.Yong Ning et.al 26 prepared Al2O3-TI2SiC composite by the hot pressing technique with a different weight ratio of Al2O3.he has obtained strong peak ?= 38 o for 40% of aluminum oxide. In the present work, the same value and better crystalline nature obtained.
So it concluded that the TiB2 interacted with Al2O3/SiC structure.

 

Figure (6) XRD Observations of 20wt% TiB2 /Al2O3/SiC at 1300 oC

Table 4. Diffraction peaks of 20wt% TiB2 /Al2O3/SiC at 1300 oC

Pos. °2Th.

Height cuts

FWHM Left °2Th.

d-spacing Å

Rel. Int. %

34.8555

32.15

0.1476

2.57405

29.41

35.6227

86.35

0.1968

2.52036

78.99

38.2255

109.32

0.1476

2.35452

100.00

54.3916

14.03

0.7872

1.68683

12.83

60.0078

49.37

0.1968

1.54169

45.16

71.7782

95.88

0.1476

1.31510

87.71