X-Ray diffraction (XRD) is a quick scientific procedure utilized for stage distinguishing proof of a crystalline material and can give data on unit cell measurements 27. The XRD of 20wt% TiB2 added Al2O3/SiC composite sample was recorded with the help of Xpert-Pro Diffractometer with Cu K radiation. The data are measured at 1300oC and at a wavelength of 1.5420 nm. The diffraction peaks of sample D was observed at 2? values of angles 34.8, 35.6, 38.2, 54.3, 60.0 and 71.7 The XRD used to calculate the crystallite size (D) with the help of Scherrer’s relation.
Where, k is the shape factor usually (k=0.94), ? is the X-ray wavelength, and ? is the Full Width at Half Maximum (FWHM) of all the peaks in XRD pattern and ? is the Bragg’s angle of the X-ray diffraction peak. The average crystallite sizes ware found to be 85 nm for 1300oC. Table 4 shows the XRD values of the processed composite. The high-intensity peak observed at 2? = 38.2255.Yong Ning et.al 26 prepared Al2O3-TI2SiC composite by the hot pressing technique with a different weight ratio of Al2O3.he has obtained strong peak ?= 38 o for 40% of aluminum oxide. In the present work, the same value and better crystalline nature obtained.
So it concluded that the TiB2 interacted with Al2O3/SiC structure.
Figure (6) XRD Observations of 20wt% TiB2 /Al2O3/SiC at 1300 oC
Table 4. Diffraction peaks of 20wt% TiB2 /Al2O3/SiC at 1300 oC
FWHM Left °2Th.
Rel. Int. %