X-Ray diffraction (XRD) is a quick scientific procedure utilized for stage distinguishing proof of a crystalline material and can give data on unit cell measurements 27. The XRD of 20wt% TiB2 added Al2O3/SiC composite sample was recorded with the help of Xpert-Pro Diffractometer with Cu K radiation. The data are measured at 1300oC and at a wavelength of 1.5420 nm. The diffraction peaks of sample D was observed at 2? values of angles 34.8, 35.6, 38.2, 54.3, 60.0 and 71.7 The XRD used to calculate the crystallite size (D) with the help of Scherrer’s relation.
(1)
Where, k is the shape factor usually (k=0.94), ? is the X-ray wavelength, and ? is the Full Width at Half Maximum (FWHM) of all the peaks in XRD pattern and ? is the Bragg’s angle of the X-ray diffraction peak. The average crystallite sizes ware found to be 85 nm for 1300oC. Table 4 shows the XRD values of the processed composite. The high-intensity peak observed at 2? = 38.2255.Yong Ning et.al 26 prepared Al2O3-TI2SiC composite by the hot pressing technique with a different weight ratio of Al2O3.he has obtained strong peak ?= 38 o for 40% of aluminum oxide. In the present work, the same value and better crystalline nature obtained.
So it concluded that the TiB2 interacted with Al2O3/SiC structure.
Figure (6) XRD Observations of 20wt% TiB2 /Al2O3/SiC at 1300 oC
Table 4. Diffraction peaks of 20wt% TiB2 /Al2O3/SiC at 1300 oC
Pos. °2Th.
Height cuts
FWHM Left °2Th.
d-spacing Å
Rel. Int. %
34.8555
32.15
0.1476
2.57405
29.41
35.6227
86.35
0.1968
2.52036
78.99
38.2255
109.32
0.1476
2.35452
100.00
54.3916
14.03
0.7872
1.68683
12.83
60.0078
49.37
0.1968
1.54169
45.16
71.7782
95.88
0.1476
1.31510
87.71